Studies on physical properties of tin oxide films
DOI :
https://doi.org/10.35219/ann-ugal-math-phys-mec.2023.2.05Mots-clés :
thin films, thin oxide, structural properties, optical propertiesRésumé
This paper reports the study of some physical properties of thin films of tin oxide, such as the structural properties, surface morphology and optical transmission and reflection. The thin films of tin oxide were deposited by the method of thermal evaporation under vacuum. Transmission electron microscopy (TEM) was used to study the structural properties and the atomic force microscopy (AFM) method was used to study the surface morphology of thin films of tin oxide. The absorption and extinction coefficients of the investigated thin layers were determined from the transmittance and reflectance spectra recorded in the range of wavelengths between 190 and 1100 nm.
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Publiée
2023-12-13
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« Studies on physical properties of tin oxide films » (2023) Analele Universității ”Dunărea de Jos” din Galați. Fascicula II, Matematică, fizică, mecanică teoretică / Annals of the ”Dunarea de Jos” University of Galati. Fascicle II, Mathematics, Physics, Theoretical Mechanics, 46(2), p. 86–89. doi:10.35219/ann-ugal-math-phys-mec.2023.2.05.
