Influence of substrate temperature on the structural and optical properties of ZnSe thin films

Authors

DOI:

https://doi.org/10.35219/ann-ugal-math-phys-mec.2019.2.07

Keywords:

ZnSe thin films, XRD technique, surface morphology, roughness parameters, optical properties

Abstract

ZnSe thin films were deposited onto glass substrates by vacuum thermal evaporation technique. The substrate temperature was varied from 300 K to 473 K. The films structure was studied by means of X-ray diffraction technique (XRD). The film crystallites present a preferential orientation with the (111) planes parallel to the substrate surface. The surface morphology was investigated by vertical scanning interferometry (VSI). The surface roughness parameters of thin films were calculated. The optical properties of ZnSe thin films were investigated using spectrophotometric measurements of transmittance and reflectance in the 275-1100 nm wavelength range.

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Author Biographies

  • Nicolae Țigău, "Dunarea de Jos" University of Galati, Romania

    Faculty of Sciences and Environment, Dunarea de Jos University of Galati, 111 Domneasca Street, 800201, Galati, Romania

  • Simona Condurache-Bota, "Dunarea de Jos" University of Galati, Romania

    Faculty of Sciences and Environment, Dunarea de Jos University of Galati, 111 Domneasca Street, 800201, Galati, Romania

  • Emilian Dănilă, "Dunarea de Jos" University of Galati, Romania

    Faculty of Sciences and Environment, Dunarea de Jos University of Galati, 111 Domneasca Street, 800201 Galati, Romania

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Published

2019-11-28

Issue

Vol. 42 No. 2 (2019)

Section

Articles

How to Cite

“Influence of substrate temperature on the structural and optical properties of ZnSe thin films” (2019) Analele Universității ”Dunărea de Jos” din Galați. Fascicula II, Matematică, fizică, mecanică teoretică / Annals of the ”Dunarea de Jos” University of Galati. Fascicle II, Mathematics, Physics, Theoretical Mechanics, 42(2), pp. 167–171. doi:10.35219/ann-ugal-math-phys-mec.2019.2.07.

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