Uncertainty in testing of open circuit supply faults in CMOS logic circuits

Rustem Popa; Constantin Cruceru; Mircea Iliev

Uncertainty in testing of open circuit supply faults in CMOS logic circuits

Authors

Rustem Popa “Dunarea de Jos” University of Galati
Constantin Cruceru “Dunarea de Jos” University of Galati
Mircea Iliev “Dunarea de Jos” University of Galati

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Published

1996-11-30

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Vol. 19 (1996)

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@ "Dunarea de Jos" University of Galati

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Uncertainty in testing of open circuit supply faults in CMOS logic circuits. EEAI [Internet]. 1996 Nov. 30 [cited 2026 Nov. 2];19:44-7. Available from: https://ojs.ugal.ro/index.php/eeaci/article/view/853

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Uncertainty in testing of open circuit supply faults in CMOS logic circuits

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