ZnO-based nanostructured materials by chemical methods

Abstract

The ZnO-based nanostructured materials are considered as key materials for nanodevices fabrication. This paper presents the morphology, microstructure, optical and electrical properties of ZnO nanoparticles, ZnO nonorods with UV and ozone sensing response at room temperature and Al:ZnO TCO-type thin films, all prepared by sol-gel method. Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM) and X-Ray Diffraction techniques were used for morphological and microstructural characterization of ZnO-based nanostructured materials. The nanoparticles size was studied by Light Scattering Measurements. The UV-VIS-NIR optical spectra were recorded and the electrical properties were investigated using Hall effect measurements. The variations of the electrical resistivity with gas atmosphere and UV radiation were measured for ZnO thin films, using a special set-up.