„Conductive-Atomic Force Microscopy Investigation of the Electrical Properties of Low Temperature Deposed ZnO Transparent Thin Films“, Ann_UGAL_MMS, Bd. 38, Nr. 2, S. 22–26, Juni 2015, Zugegriffen: Nov. 02, 2026. Verfügbar unter: https://ojs.ugal.ro/index.php/mms/article/view/1329