On the Kinetics of Sol Gel Al:ZnO Thin Films Crystallization on Silicon Substrate

Autor/innen

  • Viorica MUŞAT "Dunarea de Jos" University of Galati, Romania
  • Joao CANEJO CENIMAT/I3N, Caparica, Portugal
  • Catalina ITICESCU "Dunarea de Jos" University of Galati, Romania

Schlagwörter:

Al-doped ZnO, thin films, sol-gel, X-ray diffraction, atomic force microscopy, kinetic curves

Abstract

Recently, there is a growing interest in applying ZnO thin films on silicon buffer substrates for p-n junction devices, optical wave guide, etc.
A sol gel process is very attractive technique for obtaining oxide thin films, due to easy control of film composition, easy fabrication of large area thin films with low cost and the ability to coat-specific shapes substrates.
This paper presents a kinetic investigation of the crystallization (550-650 oC) of high preferential c-axis oriented ZnO thin films on p-type (100) silicon wafer substrate, from XRD data.

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2006-11-15

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1.
On the Kinetics of Sol Gel Al:ZnO Thin Films Crystallization on Silicon Substrate. Ann_UGAL_MMS [Internet]. 15. November 2006 [zitiert 2. November 2026];29(2):27-30. Verfügbar unter: https://ojs.ugal.ro/index.php/mms/article/view/3199

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